
Calibration
SPM Calibration Overview
Rev. D Dimension 3100 Manual 307
17.1 SPM Calibration Overview
Veeco employs a software-guided calibration procedure for all microscopes. The procedural details
of how calibration is executed using NanoScope software are beyond the scope of this document
and include proprietary methods exclusive to Veeco. A brief overview of the theory is available in
Section 17.1.1. The calibration is summarized in four basic steps outlined below.
• Orthogonality Adjustments: The orthogonality adjustment compensates for a possible
non-square scan pattern.
• Scanner Linearization: Adjust parameters for correcting the capacitive nature of the
piezo material and force the X-Y motion of the tip to move at a constant velocity.
• X, Y Calibration: Designate the software conversion values using one or both of the
following methods.
• Capture Calibration and Autocalibration: A built-in software routine
automatically controls the scanner while capturing a series of data files. The data
files are then used to “teach” the software the actual distance that the scanner
moved. This process creates a customized set of conversion values that will be used
to convert the known signals to a metric scale.
-or-
• Fine Tuning: Manually test and adjust X-Y sensitivity and derating values to within
1% accuracy. The conversion values that scale the scanner motion are confirmed, or
are adjusted if necessary to within 1%. These same values should be adjusted by the
customer as the scanner ages due to use. A scanner will typically lose 10-20% of it’s
scan range over the first year of typical use. The scanner will then become stable as
long as it is not damaged.
• Calibrate Z: Calibrate the Z scan tube to within 2%. A separate calibration “look-up”
table stores the conversion values for converting the control voltages applied to the Z
tube. These values are determined by scanning over a sample with a known depth.
Veeco recommends that you adhere to the following Calibration schedule (see Table 17.1a). After
initial installation, perform the Fine-Tuning X-Y Calibration (see Section 17.7) per the following
time schedule. If you find that the calibration measurements are more than 10% off at any point
during Fine-Tuning Calibration, stop and perform the Full X-Y Calibration Routine (see Section
17.2). For most applications it is sufficient to perform the Z calibration with the same frequency.
For critical height measurements we recommend monthly Z calibration.
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