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Head, Probe, & Sample Preparation

Basic AFM Operation

104 Dimension 3100 Manual Rev. D

Figure 7.2c Standard AFM Cantilever Holder

4. Orient the cantilever intended for imaging away from the cantilever holder, and place the

substrate in the AFM cantilever holder groove.

5. Carefully maneuver the substrate until the substrate is flush against the back edge and laying

flat in the cantilever holder groove.

6. Press the spring-loaded probe clip down, gently push forward over the substrate, and release

the spring clip to hold the substrate in place in the cantilever holder groove.

Note: Always orienting the substrate to one side and the back of the cantilever holder

groove will improve repeatability of tip location between runs. This will make

aligning the laser onto the cantilever quicker and easier when installing new

cantilevers.

TappingMode

The procedure for installing TappingMode, single crystal silicon substrates is the essentially the

same as the procedure for installing silicon nitride substrates in Contact Mode AFM. However, one

difference is that silicon substrates usually have only one cantilever per substrate, which can often

be identiﬁed without an optical microscope.

Note: Single crystal silicon substrates are installed face-up so the tip points away

from the AFM cantilever holder. This ensures that the cantilever and tip face

toward the sample once the cantilever holder is mounted on the head.

SIDE VIEW

tip is

installed

BOTTOM VIE

( TIP SIDE )

no tip

installed

Spring Loaded Probe Clip

Cantilever Probe Tip

( tip faces down )

Cantilever

Mounting

Groove

Electrical Mounting Sockets

( 4 plcs)

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Dell 3100 Spezifikationen Seite 124