Dell 3100 Spezifikationen PDF herunterladen (Seite 15)

List of Figures

Rev. D Dimension 3100 Manual xv

Figure 5.2r Stage Initializing Prompt. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .84

Figure 5.2s Optics Move to End of Travel Prompt. . . . . . . . . . . . . . . . . . . . .84

Figure 5.2t Stage Zoom Prompt . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .84

Figure 5.2u Stage Zoom Out Prompt . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .85

Chapter 6 Cantilever Preparation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .87

Figure 6.1a Silicon Cantilever Substrates in Wafer . . . . . . . . . . . . . . . . . . . .89

Figure 6.1b Theoretical Tip Shape of Silicon Probes. . . . . . . . . . . . . . . . . . .90

Figure 6.1c Silicon Probe Tip Proﬁle Artifact (Front-to-Back) . . . . . . . . . . .91

Figure 6.1d Silicon Probe Tip Step Proﬁle Artifact (Side-to-Side) . . . . . . . .92

Figure 6.1e Common Silicon Probe Proﬁle (Resultant Scan Artifact). . . . . .92

Figure 6.2a Silicon Nitride Cantilevers in a Wafer. . . . . . . . . . . . . . . . . . . . .93

Figure 6.2b Substrate Break-off . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .95

Figure 6.2c Silicon Nitride Cantilevers . . . . . . . . . . . . . . . . . . . . . . . . . . . . .96

Figure 6.2d Silicon Nitride Cantilevers (proﬁle) . . . . . . . . . . . . . . . . . . . . . .97

Chapter 7 Head, Probe, & Sample Preparation . . . . . . . . . . . . . . . . . . . . . . . .99

Figure 7.2a Microscope Select Prompt . . . . . . . . . . . . . . . . . . . . . . . . . . . .102

Figure 7.2b Cantilever Holder Stand (top view) . . . . . . . . . . . . . . . . . . . . .103

Figure 7.2c Standard AFM Cantilever Holder . . . . . . . . . . . . . . . . . . . . . . .104

Figure 7.2d SPM Head Dovetail and Signal Connector. . . . . . . . . . . . . . . .105

Figure 7.2e Dimension Head Laser Control Knobs . . . . . . . . . . . . . . . . . . .107

Figure 7.2f Etched Silicon Tip Laser Alignment . . . . . . . . . . . . . . . . . . . . .108

Figure 7.2g Photodetector Adjustment Knobs . . . . . . . . . . . . . . . . . . . . . . .109

Figure 7.2h Silicon Nitride Laser Alignment . . . . . . . . . . . . . . . . . . . . . . . .110

Figure 7.2i Vision System Window . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112

Figure 7.2j Photodetector Mirror Adjustment Knobs. . . . . . . . . . . . . . . . . .113

Figure 7.2k Securing Double-sided Tape to the Sample Disk . . . . . . . . . . .114

Figure 7.2l Securing the Sample . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115

Figure 7.3a Default SPM Stage Parameters . . . . . . . . . . . . . . . . . . . . . . . . .118

Chapter 8 Contact AFM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .119

Figure 8.1a Select Show All Items . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .122

Figure 8.1b Enable Parameters. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .122

Figure 8.1c Suggested Scan Controls Settings. . . . . . . . . . . . . . . . . . . . . . .123

Figure 8.1d Suggested Other Controls Settings . . . . . . . . . . . . . . . . . . . . . .123

Figure 8.1e Suggested Feedback Controls Settings . . . . . . . . . . . . . . . . . . .124

Figure 8.1f Suggested Channel Controls Settings . . . . . . . . . . . . . . . . . . . .124

Figure 8.2a Force Curve . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .126

Chapter 9 TappingMode AFM. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .131

Figure 9.1a Tapping Cantilever in Free Air . . . . . . . . . . . . . . . . . . . . . . . . .132

Figure 9.1b Tapping Cantilever on Sample Surface. . . . . . . . . . . . . . . . . . .133

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Keine Kommentare

Dell 3100 Spezifikationen Seite 15